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Degradation by Electromigration
Storyboard

Under high current density, the "wind" of electrons transports metal atoms across the interconnections, forming voids that eventually cause open circuit.

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ID:('ky', 1739)

Model Structure
Description

ID:(0, 1739)

gphysics.net - Dr. Willy H. Gerber
Palos Verdes, Costa de Corral, Región de los Rios, Chile